| Name | Description |
|---|---|
| FEI_G20_LaB6_TEM | 200kV HRTEM, CryoTEM, Electron Tomography |
| FEI_Tecnai_Spirit_TEM_120kV | 120kV TEM |
| Hitachi_S2600N_Variable_Pressure_SEM | SEM, EDX |
| Main_Lab_Rm0144_calendar | |
| Staff_Availability_at_BIF | |
| Zeiss_CrossBeam350_CryoFIB_SEM | Field emission (FE) SEM, Focused ion beam (FIB) milling, EDX, CryoSEM, CryoFIB |