Group: Electron_microscopes
Name Description
FEI_G20_LaB6_TEM 200kV HRTEM, CryoTEM, Electron Tomography
FEI_Tecnai_Spirit_TEM_120kV 120kV TEM
Hitachi_S2600N_Variable_Pressure_SEM SEM, EDX
Main_Lab_Rm0144_calendar
Staff_Availability_at_BIF
Zeiss_CrossBeam350_CryoFIB_SEM Field emission (FE) SEM, Focused ion beam (FIB) milling, EDX, CryoSEM, CryoFIB

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